Originally published in 2005, this book covers the closely related techniques of electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) specifically from a geological viewpoint.

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Electron microprobe analysis is a sensitive technique for non-destructive quantification of the chemical composition of in situ micrometer volumes of solid mate- rial (minerals, alloys, ceramics, ...

The instrument is a dedicated field emission, wavelength dispersive electron microprobe (EPMA). Quantitative elemental data can be obtained from most elements (Fluorine to Uranium) with detection ...

The electron microprobe is the premiere instrument for performing non-destructive, in-situ, quantitative chemical analysis of solid materials via wavelength dispersive spectrometry. EMP surface ...

The Robert M. MacKay Electron Microprobe Laboratory (EMPA laboratory) in the Department of Earth Sciences has operated as a regional facility since 1984. In 2006 the lab became affiliated with the ...

The wavelength dispersive X-ray (WDX) electron microprobe is capable of unattended overnight elemental analysis of materials in polished sections or blocks. Images from the sample surface can also be ...

Instrumental stability – The stability of a microprobe generally refers to the beam stability ... The shape of the filament and its electron-emission profile change as the filament ages, both of which ...

The Lab has an Electron Microprobe; an automated powder diffraction system, and a SEM equipped with a backscattered electron detector, a cathodoluminescence detector, and a light-element energy ...

The Perkin Elmer PHI-660 scanning Auger microprobe can be used for the compositional analysis of specimen surfaces using Auger electron spectroscopy (AES). The probe depth of AES is on the order of ...

The Electron probe microanalyzer or "microprobe" is designed for non-destructive micrometer-sized spot quantitative chemical analysis from polished mineral sample surfaces. Scanning Electron ...